Chun Sheng Jiang

Chun Sheng Jiang

20022023

Research Activity per Year

Overview

Personal Profile

Chun-Sheng Jiang is a senior scientist in the Analytical Microscopy and Imaging Science group of the Materials Science Center. His primary field is scanning probe microscopy (SPM) and device physics of photovoltaic and energy storage technologies. He has conducted pioneer nanometer-scale characterization for photovoltaic technology by developing and applying SPM-based nanoelectrical probes of Kelvin probe force microscopy (KPFM), scanning capacitance microscopy (SCM), and scanning spreading resistance microscopy (SSRM). These characterizations involve a wide range of photovoltaic materials and devices including organic-inorganic hybrid perovskite, CdTe, Cu(In,Cu)Se2, crystalline Si, III-V, and amorphous and nanocrystalline Si. He has authored more than 50 publications and coauthored more than 150. 

Research Interests

Development of novel nanometer-resolution probe techniques for a wide range of renewable energy research.

Nanoelectrical characterization and device physics of new emerging and commercialized high-efficiency photovoltaics, and photovoltaic reliability related to material science.

Nanometer-scale in-situ and ex-situ characterization of Li-ion and Li-metal batteries, as well as photoelectrochemical water-splitting for hydrogen.

Education/Academic Qualification

Bachelor, Physics, Dalian University of Science and Technology

Master, Physics, Harbin Institute of Technology

PhD, Physics, University of Tokyo

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