Personal Profile

Steve Johnston is a senior scientist on the Microscopy and Imaging team of the Materials Science center of NREL. He received his B.S. in Engineering from the Colorado School of Mines (CSM); M.S. from the University of Illinois, Urbana-Champaign, in Electrical Engineering; and Ph.D. from CSM in Materials Science. He worked for more than two years at Texas Instruments with clean-room semiconductor processing and measurement equipment. He has experience with NREL in minority-carrier lifetime, capacitance-related, and imaging-based measurement techniques for solar cell materials. 

Research Interests

Microwave reflection photoconductive decay, transient free-carrier absorption, and time-resolved photoluminescence for minority-carrier lifetime and light-beam induced current for quantum efficiency and diffusion length measurements.

Electroluminescence imaging, photoluminescence imaging, and lock-in thermography for material and cell characterization.

Capacitance/voltage, admittance spectroscopy, and deep-level transient spectroscopy for characterization of carrier concentration and defect and impurity levels. 

Education/Academic Qualification

PhD, Materials Science, Colorado School of Mines

Bachelor, Engineering, Colorado School of Mines

Master, Electrical Engineering, University of Illinois at Urbana-Champaign


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