3D and Multimodal X-Ray Microscopy Reveals the Impact of Voids in CIGS Solar Cells: Article No. 2301873

Giovanni Fevola; Christina Ossig; Mariana Verezhak; Jan Garrevoet; Harvey Guthrey; Martin Seyrich; Dennis Bruckner; Johannes Hagemann; Frank Seiboth; Andreas Schropp; Gerald Falkenberg; Peter Jorgensen; Azat Slyamov; Zoltan Balogh; Christian Strelow; Tobias Kipp; Alf Mews; Christian Schroer; Shiro Nishiwaki; Romain Carron; Jens Andreasen; Michael Stuckelberger

doi:10.1002/advs.202301873

3D and Multimodal X-Ray Microscopy Reveals the Impact of Voids in CIGS Solar Cells: Article No. 2301873

Giovanni Fevola, Christina Ossig, Mariana Verezhak, Jan Garrevoet, Harvey Guthrey, Martin Seyrich, Dennis Bruckner, Johannes Hagemann, Frank Seiboth, Andreas Schropp, Gerald Falkenberg, Peter Jorgensen, Azat Slyamov, Zoltan Balogh, Christian Strelow, Tobias Kipp, Alf Mews, Christian Schroer, Shiro Nishiwaki, Romain CarronJens Andreasen, Michael Stuckelberger

Materials Science

Research output: Contribution to journal › Article › peer-review

Abstract

Small voids in the absorber layer of thin-film solar cells are generally suspected to impair photovoltaic performance. They have been studied on Cu(In,Ga)Se2 cells with conventional laboratory techniques, albeit limited to surface characterization and often affected by sample-preparation artifacts. Here, synchrotron imaging is performed on a fully operational as-deposited solar cell containing a few tens of voids. By measuring operando current and X-ray excited optical luminescence, the local electrical and optical performance in the proximity of the voids are estimated, and via ptychographic tomography, the depth in the absorber of the voids is quantified. Besides, the complex network of material-deficit structures between the absorber and the top electrode is highlighted. Despite certain local impairments, the massive presence of voids in the absorber suggests they only have a limited detrimental impact on performance.

Original language	American English
Number of pages	8
Journal	Advanced Science
Volume	11
Issue number	2
DOIs	https://doi.org/10.1002/advs.202301873
State	Published - 2024

NREL Publication Number

NREL/JA-5K00-88498

Keywords

CIGS
multimodal X-ray imaging
nano-tomography
ptychography
thin film solar cells

Access to Document

10.1002/advs.202301873

https://www.nrel.gov/docs/fy24osti/88498.pdf

Cite this

Fevola, G., Ossig, C., Verezhak, M., Garrevoet, J., Guthrey, H., Seyrich, M., Bruckner, D., Hagemann, J., Seiboth, F., Schropp, A., Falkenberg, G., Jorgensen, P., Slyamov, A., Balogh, Z., Strelow, C., Kipp, T., Mews, A., Schroer, C., Nishiwaki, S., ... Stuckelberger, M. (2024). 3D and Multimodal X-Ray Microscopy Reveals the Impact of Voids in CIGS Solar Cells: Article No. 2301873. Advanced Science, 11(2). https://doi.org/10.1002/advs.202301873

@article{d86a127f736942a5a1a9d83a71501aa4,

title = "3D and Multimodal X-Ray Microscopy Reveals the Impact of Voids in CIGS Solar Cells: Article No. 2301873",

abstract = "Small voids in the absorber layer of thin-film solar cells are generally suspected to impair photovoltaic performance. They have been studied on Cu(In,Ga)Se2 cells with conventional laboratory techniques, albeit limited to surface characterization and often affected by sample-preparation artifacts. Here, synchrotron imaging is performed on a fully operational as-deposited solar cell containing a few tens of voids. By measuring operando current and X-ray excited optical luminescence, the local electrical and optical performance in the proximity of the voids are estimated, and via ptychographic tomography, the depth in the absorber of the voids is quantified. Besides, the complex network of material-deficit structures between the absorber and the top electrode is highlighted. Despite certain local impairments, the massive presence of voids in the absorber suggests they only have a limited detrimental impact on performance.",

keywords = "CIGS, multimodal X-ray imaging, nano-tomography, ptychography, thin film solar cells",

author = "Giovanni Fevola and Christina Ossig and Mariana Verezhak and Jan Garrevoet and Harvey Guthrey and Martin Seyrich and Dennis Bruckner and Johannes Hagemann and Frank Seiboth and Andreas Schropp and Gerald Falkenberg and Peter Jorgensen and Azat Slyamov and Zoltan Balogh and Christian Strelow and Tobias Kipp and Alf Mews and Christian Schroer and Shiro Nishiwaki and Romain Carron and Jens Andreasen and Michael Stuckelberger",

year = "2024",

doi = "10.1002/advs.202301873",

language = "American English",

volume = "11",

journal = "Advanced Science",

issn = "2198-3844",

number = "2",

}

Fevola, G, Ossig, C, Verezhak, M, Garrevoet, J, Guthrey, H, Seyrich, M, Bruckner, D, Hagemann, J, Seiboth, F, Schropp, A, Falkenberg, G, Jorgensen, P, Slyamov, A, Balogh, Z, Strelow, C, Kipp, T, Mews, A, Schroer, C, Nishiwaki, S, Carron, R, Andreasen, J & Stuckelberger, M 2024, '3D and Multimodal X-Ray Microscopy Reveals the Impact of Voids in CIGS Solar Cells: Article No. 2301873', Advanced Science, vol. 11, no. 2. https://doi.org/10.1002/advs.202301873

TY - JOUR

T1 - 3D and Multimodal X-Ray Microscopy Reveals the Impact of Voids in CIGS Solar Cells

T2 - Article No. 2301873

AU - Fevola, Giovanni

AU - Ossig, Christina

AU - Verezhak, Mariana

AU - Garrevoet, Jan

AU - Guthrey, Harvey

AU - Seyrich, Martin

AU - Bruckner, Dennis

AU - Hagemann, Johannes

AU - Seiboth, Frank

AU - Schropp, Andreas

AU - Falkenberg, Gerald

AU - Jorgensen, Peter

AU - Slyamov, Azat

AU - Balogh, Zoltan

AU - Strelow, Christian

AU - Kipp, Tobias

AU - Mews, Alf

AU - Schroer, Christian

AU - Nishiwaki, Shiro

AU - Carron, Romain

AU - Andreasen, Jens

AU - Stuckelberger, Michael

PY - 2024

Y1 - 2024

N2 - Small voids in the absorber layer of thin-film solar cells are generally suspected to impair photovoltaic performance. They have been studied on Cu(In,Ga)Se2 cells with conventional laboratory techniques, albeit limited to surface characterization and often affected by sample-preparation artifacts. Here, synchrotron imaging is performed on a fully operational as-deposited solar cell containing a few tens of voids. By measuring operando current and X-ray excited optical luminescence, the local electrical and optical performance in the proximity of the voids are estimated, and via ptychographic tomography, the depth in the absorber of the voids is quantified. Besides, the complex network of material-deficit structures between the absorber and the top electrode is highlighted. Despite certain local impairments, the massive presence of voids in the absorber suggests they only have a limited detrimental impact on performance.

AB - Small voids in the absorber layer of thin-film solar cells are generally suspected to impair photovoltaic performance. They have been studied on Cu(In,Ga)Se2 cells with conventional laboratory techniques, albeit limited to surface characterization and often affected by sample-preparation artifacts. Here, synchrotron imaging is performed on a fully operational as-deposited solar cell containing a few tens of voids. By measuring operando current and X-ray excited optical luminescence, the local electrical and optical performance in the proximity of the voids are estimated, and via ptychographic tomography, the depth in the absorber of the voids is quantified. Besides, the complex network of material-deficit structures between the absorber and the top electrode is highlighted. Despite certain local impairments, the massive presence of voids in the absorber suggests they only have a limited detrimental impact on performance.

KW - CIGS

KW - multimodal X-ray imaging

KW - nano-tomography

KW - ptychography

KW - thin film solar cells

U2 - 10.1002/advs.202301873

DO - 10.1002/advs.202301873

M3 - Article

SN - 2198-3844

VL - 11

JO - Advanced Science

JF - Advanced Science

IS - 2

ER -

3D and Multimodal X-Ray Microscopy Reveals the Impact of Voids in CIGS Solar Cells: Article No. 2301873

Abstract

NREL Publication Number

Keywords

Access to Document

Fingerprint

Cite this