A Comparison of Photoluminescence Imaging and Confocal Photoluminescence Microscopy in the Study of Diffusion Near Isolated Extended Defects in GaAs

    Research output: Contribution to conferencePaper

    Original languageAmerican English
    Pages001624-001626
    Number of pages3
    DOIs
    StatePublished - 2012
    Event38th IEEE Photovoltaic Specialists Conference (PVSC '12) - Austin, Texas
    Duration: 3 Jun 20128 Jun 2012

    Conference

    Conference38th IEEE Photovoltaic Specialists Conference (PVSC '12)
    CityAustin, Texas
    Period3/06/128/06/12

    NREL Publication Number

    • NREL/CP-5200-57522

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