A Comparison of Photoluminescence Imaging and Confocal Photoluminescence Microscopy in the Study of Diffusion Near Isolated Extended Defects in GaAs

M.W. Wanlass; Yong Zhang; T.H. Gfroerer

doi:10.1109/PVSC.2012.6317907

A Comparison of Photoluminescence Imaging and Confocal Photoluminescence Microscopy in the Study of Diffusion Near Isolated Extended Defects in GaAs

M.W. Wanlass
, Yong Zhang
, T.H. Gfroerer

Research output: Contribution to conference › Paper

Original language	American English
Pages	001624-001626
Number of pages	3
DOIs	https://doi.org/10.1109/PVSC.2012.6317907
State	Published - 2012
Event	38th IEEE Photovoltaic Specialists Conference (PVSC '12) - Austin, Texas Duration: 3 Jun 2012 → 8 Jun 2012

Conference

Conference	38th IEEE Photovoltaic Specialists Conference (PVSC '12)
City	Austin, Texas
Period	3/06/12 → 8/06/12

NLR Publication Number

NREL/CP-5200-57522

Access to Document

10.1109/PVSC.2012.6317907

Cite this

@conference{b76a0cfce154475a9e69c94de77dcda1,

title = "A Comparison of Photoluminescence Imaging and Confocal Photoluminescence Microscopy in the Study of Diffusion Near Isolated Extended Defects in GaAs",

author = "M.W. Wanlass and Yong Zhang and T.H. Gfroerer",

year = "2012",

doi = "10.1109/PVSC.2012.6317907",

language = "American English",

pages = "001624--001626",

note = "38th IEEE Photovoltaic Specialists Conference (PVSC \'12) ; Conference date: 03-06-2012 Through 08-06-2012",

}

TY - CONF

T1 - A Comparison of Photoluminescence Imaging and Confocal Photoluminescence Microscopy in the Study of Diffusion Near Isolated Extended Defects in GaAs

AU - Wanlass, M.W.

AU - Zhang, Yong

AU - Gfroerer, T.H.

PY - 2012

Y1 - 2012

U2 - 10.1109/PVSC.2012.6317907

DO - 10.1109/PVSC.2012.6317907

M3 - Paper

SP - 1624

EP - 1626

T2 - 38th IEEE Photovoltaic Specialists Conference (PVSC '12)

Y2 - 3 June 2012 through 8 June 2012

ER -