A Custom High-Throughput Optical Mapping Instrument for Accelerated Stress Testing of PV Module Materials

Imran Khan, Joshua Morse, Robert White, David Miller

Research output: Contribution to journalArticlepeer-review

5 Scopus Citations

Abstract

The performance and integrity of photovoltaic (PV) modules and materials may be assessed through optical characterizations. We have developed a custom optical mapping instrument (OMI) to improve measurement throughput time, facilitate automated measurements, allow for localized specimen examination, obtain spatial information relative to commercial benchtop spectrophotometer instruments, and provide automated data analysis. Both the key components and the methods used to improve the measurements are described. The measurement precision for the OMI is benchmarked for hemispherical transmittance relative to a previous round-robin study for commercial spectrophotometers. In addition to the unique instrument developed in this study, new insights have emerged from the examination of specimens from previous experiments, including: the depletion of the UV absorber is revealed for specimens beyond a certain size after artificial ultraviolet (UV) weathering; an optical degradation by internal haze formation is confirmed following Damp Heat (85 °C/85% relative humidity) testing; the better uniformity of the wear pattern for falling sand abrasion is used to select the DIN 52348 fixture over the ASTM D968 fixture; and the greater local (in the order of millimeters) heterogeneity of surface contamination in the soiling-prone location of Dubai relative to Kuwait. The results of the UV study have already been used to improve the standardized weathering of encapsulants. The example for Damp Heat testing is given to increase awareness of a degradation believed to be ubiquitously occurring in safety and design-type qualification testing of PV modules.

Original languageAmerican English
Pages (from-to)73-80
Number of pages8
JournalIEEE Journal of Photovoltaics
Volume12
Issue number1
DOIs
StatePublished - 2022

Bibliographical note

Publisher Copyright:
© 2011-2012 IEEE.

NREL Publication Number

  • NREL/JA-5K00-78974

Keywords

  • Durable Module Materials Consortium (DuraMAT)
  • IEC TS 62788-7-2
  • Photovoltaic Quality Assurance Task Force
  • reliability

Fingerprint

Dive into the research topics of 'A Custom High-Throughput Optical Mapping Instrument for Accelerated Stress Testing of PV Module Materials'. Together they form a unique fingerprint.

Cite this