A Hall Probe Technique for Characterizing High-Temperature Superconductors

Jue Zhang; P. Sheldon; R. K. Ahrenkiel

doi:10.1063/1.1143147

A Hall Probe Technique for Characterizing High-Temperature Superconductors

Jue Zhang, P. Sheldon, R. K. Ahrenkiel

Materials Science

Research output: Contribution to journal › Article › peer-review

3 Scopus Citations

Abstract

Thin-film GaAs Hall probes were fabricated by molecular beam epitaxy technology. A contactless technique was developed to characterize thin-film, high-temperature superconducting (HTSC) materials. The Hall probes detected the ac magnetic flux penetration through the high-temperature superconducting materials. The Hall detector has advantages over the mutual inductance magnetic flux detector.

Original language	American English
Pages (from-to)	2259-2262
Number of pages	4
Journal	Review of Scientific Instruments
Volume	63
Issue number	4
DOIs	https://doi.org/10.1063/1.1143147 https://doi.org/10.1063/1.1143147
State	Published - 1992

Bibliographical note

TP-213-4393

NREL Publication Number

ACNR/JA-213-12392

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Cite this

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title = "A Hall Probe Technique for Characterizing High-Temperature Superconductors",

abstract = "Thin-film GaAs Hall probes were fabricated by molecular beam epitaxy technology. A contactless technique was developed to characterize thin-film, high-temperature superconducting (HTSC) materials. The Hall probes detected the ac magnetic flux penetration through the high-temperature superconducting materials. The Hall detector has advantages over the mutual inductance magnetic flux detector.",

author = "Jue Zhang and P. Sheldon and Ahrenkiel, {R. K.}",

note = "TP-213-4393",

year = "1992",

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language = "American English",

volume = "63",

pages = "2259--2262",

journal = "Review of Scientific Instruments",

issn = "0034-6748",

publisher = "American Institute of Physics",

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T1 - A Hall Probe Technique for Characterizing High-Temperature Superconductors

AU - Zhang, Jue

AU - Sheldon, P.

AU - Ahrenkiel, R. K.

N1 - TP-213-4393

PY - 1992

Y1 - 1992

N2 - Thin-film GaAs Hall probes were fabricated by molecular beam epitaxy technology. A contactless technique was developed to characterize thin-film, high-temperature superconducting (HTSC) materials. The Hall probes detected the ac magnetic flux penetration through the high-temperature superconducting materials. The Hall detector has advantages over the mutual inductance magnetic flux detector.

AB - Thin-film GaAs Hall probes were fabricated by molecular beam epitaxy technology. A contactless technique was developed to characterize thin-film, high-temperature superconducting (HTSC) materials. The Hall probes detected the ac magnetic flux penetration through the high-temperature superconducting materials. The Hall detector has advantages over the mutual inductance magnetic flux detector.

UR - http://www.scopus.com/inward/record.url?scp=36449002912&partnerID=8YFLogxK

U2 - 10.1063/1.1143147

DO - 10.1063/1.1143147

M3 - Article

AN - SCOPUS:36449002912

SN - 0034-6748

VL - 63

SP - 2259

EP - 2262

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 4

ER -

A Hall Probe Technique for Characterizing High-Temperature Superconductors

Abstract

Bibliographical note

NREL Publication Number

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