A Novel Technique for Performing PID Susceptibility Screening during the Solar Cell Fabrication Process

Peter Hacke; Jaewon Oh; Som Dahal; Bill Dauksher; Stuart Bowden; Govindasamy Tamizhmani

doi:10.1109/PVSC.2016.7749741

A Novel Technique for Performing PID Susceptibility Screening during the Solar Cell Fabrication Process

Peter Hacke, Jaewon Oh, Som Dahal, Bill Dauksher, Stuart Bowden, Govindasamy Tamizhmani

Materials Science

Arizona State University

Research output: Contribution to conference › Paper › peer-review

3 Scopus Citations

Abstract

Various characterization techniques have historically been developed in order to screen potential induced degradation (PID)-susceptible cells, but those techniques require final solar cells. We present a new characterization technique for screening PID-susceptible cells during the cell fabrication process. Illuminated Lock-In Thermography (ILIT) was used to image PID shunting of the cell without metallization and clearly showed PID-affected areas. PID-susceptible cells can be screened by ILIT, and the sample structure can advantageously be simplified as long as the sample has the silicon nitride antireflection coating and an aluminum back surface field.

Original language	American English
Pages	907-910
Number of pages	4
DOIs	https://doi.org/10.1109/PVSC.2016.7749741 https://doi.org/10.1109/PVSC.2016.7749741
State	Published - 18 Nov 2016
Event	43rd IEEE Photovoltaic Specialists Conference, PVSC 2016 - Portland, United States Duration: 5 Jun 2016 → 10 Jun 2016

Conference

Conference	43rd IEEE Photovoltaic Specialists Conference, PVSC 2016
Country/Territory	United States
City	Portland
Period	5/06/16 → 10/06/16

Bibliographical note

Publisher Copyright:
© 2016 IEEE.

NREL Publication Number

NREL/CP-5J00-65813

Keywords

electroluminescence
lock-in thermography
photovoltaic cells
PID
reliability
silicon

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

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Hacke, P., Oh, J., Dahal, S., Dauksher, B., Bowden, S., & Tamizhmani, G. (2016). A Novel Technique for Performing PID Susceptibility Screening during the Solar Cell Fabrication Process. 907-910. Paper presented at 43rd IEEE Photovoltaic Specialists Conference, PVSC 2016, Portland, United States. https://doi.org/10.1109/PVSC.2016.7749741, https://doi.org/10.1109/PVSC.2016.7749741

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abstract = "Various characterization techniques have historically been developed in order to screen potential induced degradation (PID)-susceptible cells, but those techniques require final solar cells. We present a new characterization technique for screening PID-susceptible cells during the cell fabrication process. Illuminated Lock-In Thermography (ILIT) was used to image PID shunting of the cell without metallization and clearly showed PID-affected areas. PID-susceptible cells can be screened by ILIT, and the sample structure can advantageously be simplified as long as the sample has the silicon nitride antireflection coating and an aluminum back surface field.",

keywords = "electroluminescence, lock-in thermography, photovoltaic cells, PID, reliability, silicon",

author = "Peter Hacke and Jaewon Oh and Som Dahal and Bill Dauksher and Stuart Bowden and Govindasamy Tamizhmani",

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Hacke, P, Oh, J, Dahal, S, Dauksher, B, Bowden, S & Tamizhmani, G 2016, 'A Novel Technique for Performing PID Susceptibility Screening during the Solar Cell Fabrication Process', Paper presented at 43rd IEEE Photovoltaic Specialists Conference, PVSC 2016, Portland, United States, 5/06/16 - 10/06/16 pp. 907-910. https://doi.org/10.1109/PVSC.2016.7749741, https://doi.org/10.1109/PVSC.2016.7749741

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T1 - A Novel Technique for Performing PID Susceptibility Screening during the Solar Cell Fabrication Process

AU - Hacke, Peter

AU - Oh, Jaewon

AU - Dahal, Som

AU - Dauksher, Bill

AU - Bowden, Stuart

AU - Tamizhmani, Govindasamy

PY - 2016/11/18

Y1 - 2016/11/18

N2 - Various characterization techniques have historically been developed in order to screen potential induced degradation (PID)-susceptible cells, but those techniques require final solar cells. We present a new characterization technique for screening PID-susceptible cells during the cell fabrication process. Illuminated Lock-In Thermography (ILIT) was used to image PID shunting of the cell without metallization and clearly showed PID-affected areas. PID-susceptible cells can be screened by ILIT, and the sample structure can advantageously be simplified as long as the sample has the silicon nitride antireflection coating and an aluminum back surface field.

AB - Various characterization techniques have historically been developed in order to screen potential induced degradation (PID)-susceptible cells, but those techniques require final solar cells. We present a new characterization technique for screening PID-susceptible cells during the cell fabrication process. Illuminated Lock-In Thermography (ILIT) was used to image PID shunting of the cell without metallization and clearly showed PID-affected areas. PID-susceptible cells can be screened by ILIT, and the sample structure can advantageously be simplified as long as the sample has the silicon nitride antireflection coating and an aluminum back surface field.

KW - electroluminescence

KW - lock-in thermography

KW - photovoltaic cells

KW - PID

KW - reliability

KW - silicon

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T2 - 43rd IEEE Photovoltaic Specialists Conference, PVSC 2016

Y2 - 5 June 2016 through 10 June 2016

ER -

A Novel Technique for Performing PID Susceptibility Screening during the Solar Cell Fabrication Process

Abstract

Conference

Bibliographical note

NREL Publication Number

Keywords

UN SDGs

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