Reflectance Spectroscopy-Based Tool for High-Speed Characterization of Silicon Wafers and Solar Cells in Commercial Production

Sudhakar Shet; Peter Rupnowski; D. Guhabiswas; C.P. Khattak

doi:10.1109/PVSC.2010.5616540

Reflectance Spectroscopy-Based Tool for High-Speed Characterization of Silicon Wafers and Solar Cells in Commercial Production

Sudhakar Shet, Peter Rupnowski, D. Guhabiswas, C.P. Khattak

Chemistry and Nanoscience

Research output: Contribution to conference › Paper

Original language	American English
Pages	002238-002241
Number of pages	4
DOIs	https://doi.org/10.1109/PVSC.2010.5616540
State	Published - 2010
Event	35th IEEE Photovoltaic Specialists Conference (PVSC '10) - Honolulu, Hawaii Duration: 20 Jun 2010 → 25 Jun 2010

Conference

Conference	35th IEEE Photovoltaic Specialists Conference (PVSC '10)
City	Honolulu, Hawaii
Period	20/06/10 → 25/06/10

NREL Publication Number

NREL/CP-520-47730

Keywords

photovoltaic cells
reflectance spectroscopy
silicon wafers

Access to Document

10.1109/PVSC.2010.5616540

Cite this

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title = "Reflectance Spectroscopy-Based Tool for High-Speed Characterization of Silicon Wafers and Solar Cells in Commercial Production",

keywords = "photovoltaic cells, reflectance spectroscopy, silicon wafers",

author = "Sudhakar Shet and Peter Rupnowski and D. Guhabiswas and C.P. Khattak",

year = "2010",

doi = "10.1109/PVSC.2010.5616540",

language = "American English",

pages = "002238--002241",

note = "35th IEEE Photovoltaic Specialists Conference (PVSC \'10) ; Conference date: 20-06-2010 Through 25-06-2010",

}

TY - CONF

T1 - Reflectance Spectroscopy-Based Tool for High-Speed Characterization of Silicon Wafers and Solar Cells in Commercial Production

AU - Shet, Sudhakar

AU - Rupnowski, Peter

AU - Guhabiswas, D.

AU - Khattak, C.P.

PY - 2010

Y1 - 2010

KW - photovoltaic cells

KW - reflectance spectroscopy

KW - silicon wafers

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U2 - 10.1109/PVSC.2010.5616540

DO - 10.1109/PVSC.2010.5616540

M3 - Paper

SP - 2238

EP - 2241

T2 - 35th IEEE Photovoltaic Specialists Conference (PVSC '10)

Y2 - 20 June 2010 through 25 June 2010

ER -

Reflectance Spectroscopy-Based Tool for High-Speed Characterization of Silicon Wafers and Solar Cells in Commercial Production

Conference

NREL Publication Number

Keywords

Access to Document

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Cite this