A Review of Degradation Behavior and Modeling of Capacitors

Douglas DeVoto, Joshua Major, Anunay Gupta, Om Yadav

Research output: Contribution to conferencePaperpeer-review

45 Scopus Citations

Abstract

This paper firstly reviews the failure causes, modes and mechanisms of two major types of capacitors used in power electronic systems - metallized film capacitors and electrolytic capacitors. The degradation modeling related to these capacitors is then presented. Both physics-of-failure and data-driven degradation models for reliability and lifetime estimation are discussed. Based on the exhaustive literature review on degradation modeling of capacitors, we provide a critical assessment and future research directions.

Original languageAmerican English
Number of pages10
DOIs
StatePublished - 2018
EventASME 2018 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems, InterPACK 2018 - San Francisco, United States
Duration: 27 Aug 201830 Aug 2018

Conference

ConferenceASME 2018 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems, InterPACK 2018
Country/TerritoryUnited States
CitySan Francisco
Period27/08/1830/08/18

Bibliographical note

See NREL/CP-5400-71386 for preprint

NREL Publication Number

  • NREL/CP-5400-72930

Keywords

  • electrolytic capacitors
  • metallized film capacitors
  • power electronic system

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