A Review of Degradation Behavior and Modeling of Capacitors

Douglas DeVoto; Joshua Major; Anunay Gupta; Om Yadav

doi:10.1115/IPACK2018-8262

A Review of Degradation Behavior and Modeling of Capacitors

Douglas DeVoto, Joshua Major, Anunay Gupta, Om Yadav

Center for Integrated Mobility Sciences

North Dakota State University

Research output: Contribution to conference › Paper › peer-review

49 Scopus Citations

Abstract

This paper firstly reviews the failure causes, modes and mechanisms of two major types of capacitors used in power electronic systems - metallized film capacitors and electrolytic capacitors. The degradation modeling related to these capacitors is then presented. Both physics-of-failure and data-driven degradation models for reliability and lifetime estimation are discussed. Based on the exhaustive literature review on degradation modeling of capacitors, we provide a critical assessment and future research directions.

Original language	American English
Number of pages	10
DOIs	https://doi.org/10.1115/IPACK2018-8262 https://doi.org/10.1115/IPACK2018-8262
State	Published - 2018
Event	ASME 2018 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems, InterPACK 2018 - San Francisco, United States Duration: 27 Aug 2018 → 30 Aug 2018

Conference

Conference	ASME 2018 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems, InterPACK 2018
Country/Territory	United States
City	San Francisco
Period	27/08/18 → 30/08/18

Bibliographical note

See NREL/CP-5400-71386 for preprint

NREL Publication Number

NREL/CP-5400-72930

Keywords

electrolytic capacitors
metallized film capacitors
power electronic system

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DeVoto, D., Major, J., Gupta, A., & Yadav, O. (2018). A Review of Degradation Behavior and Modeling of Capacitors. Paper presented at ASME 2018 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems, InterPACK 2018, San Francisco, United States. https://doi.org/10.1115/IPACK2018-8262, https://doi.org/10.1115/IPACK2018-8262

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author = "Douglas DeVoto and Joshua Major and Anunay Gupta and Om Yadav",

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DeVoto, D , Major, J, Gupta, A & Yadav, O 2018, 'A Review of Degradation Behavior and Modeling of Capacitors', Paper presented at ASME 2018 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems, InterPACK 2018, San Francisco, United States, 27/08/18 - 30/08/18. https://doi.org/10.1115/IPACK2018-8262, https://doi.org/10.1115/IPACK2018-8262

A Review of Degradation Behavior and Modeling of Capacitors. / DeVoto, Douglas ; Major, Joshua; Gupta, Anunay et al.
2018. Paper presented at ASME 2018 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems, InterPACK 2018, San Francisco, United States.

Research output: Contribution to conference › Paper › peer-review

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AB - This paper firstly reviews the failure causes, modes and mechanisms of two major types of capacitors used in power electronic systems - metallized film capacitors and electrolytic capacitors. The degradation modeling related to these capacitors is then presented. Both physics-of-failure and data-driven degradation models for reliability and lifetime estimation are discussed. Based on the exhaustive literature review on degradation modeling of capacitors, we provide a critical assessment and future research directions.

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A Review of Degradation Behavior and Modeling of Capacitors

Abstract

Conference

Bibliographical note

NREL Publication Number

Keywords

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