A Versatile Johansson-Type Tender X-Ray Emission Spectrometer: Article No. 033101

S. Nowak, R. Armenta, C. Schwartz, A. Gallo, B. Abraham, A. Garcia-Esparza, E. Biasin, A. Prado, A. Maciel, D. Zhang, D. Day, Steven Christensen, T. Kroll, R. Alonso-Mori, D. Nordlund, T.-C. Weng, D. Sokaras

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26 Scopus Citations

Abstract

We present a high energy resolution x-ray spectrometer for the tender x-ray regime (1.6–5.0 keV) that was designed and operated at Stanford Synchrotron Radiation Lightsource. The instrument is developed on a Rowland geometry (500 mm of radius) using cylindrically bent Johansson analyzers and a position sensitive detector. By placing the sample inside the Rowland circle, the spectrometer operates in an energy-dispersive mode with a subnatural line-width energy resolution (~0.32 eV at 2400 eV), even when an extended incident x-ray beam is used across a wide range of diffraction angles (~30° to 65°). The spectrometer is enclosed in a vacuum chamber, and a sample chamber with independent ambient conditions is introduced to enable a versatile and fast-access sample environment (e.g., solid/gas/liquid samples, in situ cells, and radioactive materials). The design, capabilities, and performance are presented and discussed.
Original languageAmerican English
Number of pages12
JournalReview of Scientific Instruments
Volume91
Issue number3
DOIs
StatePublished - 2020

NREL Publication Number

  • NREL/JA-5K00-77171

Keywords

  • catalysis
  • crystal optics
  • elastic scattering
  • monochromators
  • radioactive material
  • resonant inelastic X-ray scattering
  • spectroscopy
  • synchrotron radiation

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