A Versatile Johansson-Type Tender X-Ray Emission Spectrometer: Article No. 033101

S. Nowak, R. Armenta, C. Schwartz, A. Gallo, B. Abraham, A. Garcia-Esparza, E. Biasin, A. Prado, A. Maciel, D. Zhang, D. Day, Steven Christensen, T. Kroll, R. Alonso-Mori, D. Nordlund, T.-C. Weng, D. Sokaras

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26 Scopus Citations


We present a high energy resolution x-ray spectrometer for the tender x-ray regime (1.6–5.0 keV) that was designed and operated at Stanford Synchrotron Radiation Lightsource. The instrument is developed on a Rowland geometry (500 mm of radius) using cylindrically bent Johansson analyzers and a position sensitive detector. By placing the sample inside the Rowland circle, the spectrometer operates in an energy-dispersive mode with a subnatural line-width energy resolution (~0.32 eV at 2400 eV), even when an extended incident x-ray beam is used across a wide range of diffraction angles (~30° to 65°). The spectrometer is enclosed in a vacuum chamber, and a sample chamber with independent ambient conditions is introduced to enable a versatile and fast-access sample environment (e.g., solid/gas/liquid samples, in situ cells, and radioactive materials). The design, capabilities, and performance are presented and discussed.
Original languageAmerican English
Number of pages12
JournalReview of Scientific Instruments
Issue number3
StatePublished - 2020

NREL Publication Number

  • NREL/JA-5K00-77171


  • catalysis
  • crystal optics
  • elastic scattering
  • monochromators
  • radioactive material
  • resonant inelastic X-ray scattering
  • spectroscopy
  • synchrotron radiation


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