AC Characterization of the Grain Boundary Electronic Properties in CdTe Thin Films

Research output: Contribution to conferencePaper

Original languageAmerican English
Number of pages2
StatePublished - 2000
EventProgram and 2000 NCPV Program Review Meeting - Denver, Colorado
Duration: 16 Apr 200019 Apr 2000


ConferenceProgram and 2000 NCPV Program Review Meeting
CityDenver, Colorado

Bibliographical note

Work performed by Colorado School of Mines, Golden, Colorado and University of Delaware, Newark, Delaware

NREL Publication Number

  • NREL/CP-520-35742

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