AC Characterization of the Grain Boundary Electronic Properties in CdTe Thin Films

Research output: Contribution to conferencePaper

Original languageAmerican English
Pages259-260
Number of pages2
StatePublished - 2000
EventProgram and 2000 NCPV Program Review Meeting - Denver, Colorado
Duration: 16 Apr 200019 Apr 2000

Conference

ConferenceProgram and 2000 NCPV Program Review Meeting
CityDenver, Colorado
Period16/04/0019/04/00

Bibliographical note

Work performed by Colorado School of Mines, Golden, Colorado and University of Delaware, Newark, Delaware

NREL Publication Number

  • NREL/CP-520-35742

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