Accelerated Stress Testing of Thin-Film Modules with SnO2:F Transparent Conductors

Carl Osterwald

Research output: Contribution to conferencePaper

Abstract

This paper reviews a testing program conducted at NREL for the past two years that applied voltage, water vapor, and light stresses to thin-film photovoltaic (PV) modules with SnO2:F transparent conducting oxides (TCOs) deposited on soda-lime glass superstrates. Electrochemical corrosion at the glass-TCO interface was observed to result in delamination of the thin-film layers. Experimentaltesting was directed toward accelerating the corrosion and understanding the nature of the resulting damage.
Original languageAmerican English
Number of pages7
StatePublished - 2003
EventNational Center for Photovoltaics (NCPV) and Solar Program Review Meeting - Denver, Colorado
Duration: 24 Mar 200326 Mar 2003

Conference

ConferenceNational Center for Photovoltaics (NCPV) and Solar Program Review Meeting
CityDenver, Colorado
Period24/03/0326/03/03

NREL Publication Number

  • NREL/CP-520-33567

Keywords

  • solar cells
  • stress testing
  • thin films
  • transparent conducting oxides (TCO)

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