Abstract
This paper reviews a testing program conducted at NREL for the past two years that applied voltage, water vapor, and light stresses to thin-film photovoltaic (PV) modules with SnO2:F transparent conducting oxides (TCOs) deposited on soda-lime glass superstrates. Electrochemical corrosion at the glass-TCO interface was observed to result in delamination of the thin-film layers. Experimentaltesting was directed toward accelerating the corrosion and understanding the nature of the resulting damage.
Original language | American English |
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Number of pages | 7 |
State | Published - 2003 |
Event | National Center for Photovoltaics (NCPV) and Solar Program Review Meeting - Denver, Colorado Duration: 24 Mar 2003 → 26 Mar 2003 |
Conference
Conference | National Center for Photovoltaics (NCPV) and Solar Program Review Meeting |
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City | Denver, Colorado |
Period | 24/03/03 → 26/03/03 |
NREL Publication Number
- NREL/CP-520-33567
Keywords
- solar cells
- stress testing
- thin films
- transparent conducting oxides (TCO)