Accurately Quantifying Stress during Metal Halide Perovskite Thin Film Formation

The role of strain in metal halide perovskite (MHP) solar cells is still under investigation, showing both beneficial and detrimental effects on the device performance and stability. One crucial component to elucidating the impact of strain in the MHP absorber is a robust method of quantifying the amount of strain in the material. Here, we present a parametric refinement approach based on grazing incidence wide-angle X-ray scattering and demonstrate its use on quantifying strain during thermal annealing and subsequent cooling as a function of substrate and processing route. We use the analysis to reveal the impact of the cubic-to-tetragonal phase transition during cooling on the material's strain and discuss texture formation as a potential strain-relief mechanism. Thereby we present both a robust approach to quantify strain in MHPs and potential mechanisms to control strain in the film, opening the path for further investigations of strain in MHPs.