Advanced Diagnostic and Control Methods of Processes and Layers in CIGS Solar Cells and Modules

Research output: Contribution to journal › Article › peer-review

Original language	American English
Pages (from-to)	467-480
Number of pages	14
Journal	Progress in Photovoltaics: Research and Applications
Volume	18
Issue number	6
DOIs	https://doi.org/10.1002/pip.966
State	Published - 2010

NREL Publication Number

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title = "Advanced Diagnostic and Control Methods of Processes and Layers in CIGS Solar Cells and Modules",

keywords = "chalcopyrite, Cu(In,Ga)Se2, light scattering, photoluminescence, Raman, solar cell, thin film",

author = "NREL",

year = "2010",

doi = "10.1002/pip.966",

language = "American English",

volume = "18",

pages = "467--480",

journal = "Progress in Photovoltaics: Research and Applications",

issn = "1062-7995",

publisher = "John Wiley and Sons Ltd",

number = "6",

}

TY - JOUR

T1 - Advanced Diagnostic and Control Methods of Processes and Layers in CIGS Solar Cells and Modules

AU - NREL, null

PY - 2010

Y1 - 2010

KW - chalcopyrite

KW - Cu(In,Ga)Se2

KW - light scattering

KW - photoluminescence

KW - Raman

KW - solar cell

KW - thin film

U2 - 10.1002/pip.966

DO - 10.1002/pip.966

M3 - Article

SN - 1062-7995

VL - 18

SP - 467

EP - 480

JO - Progress in Photovoltaics: Research and Applications

JF - Progress in Photovoltaics: Research and Applications

IS - 6

ER -