Abstract
A survey of measurement techniques for advanced photovoltaic cell technologies is presented. Characterization methods are discussed covering four areas: (1) cell performance; (2) electro-optical measurements; (3) materials characterization; and (4) surface and interface analysis. Examples are given for current solar cell research and development in both polycrystalline and single crystal technologies.
Original language | American English |
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Pages | 487-492 |
Number of pages | 6 |
State | Published - 1984 |
Event | ASES 1984: 1984 Annual Meeting, American Solar Energy Society, Inc. - Anaheim, California Duration: 5 Jun 1984 → 7 Jun 1984 |
Conference
Conference | ASES 1984: 1984 Annual Meeting, American Solar Energy Society, Inc. |
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City | Anaheim, California |
Period | 5/06/84 → 7/06/84 |
NREL Publication Number
- ACNR/CP-213-5952