Abstract
We demonstrate the controlled alteration of bulk defects in CdTe single crystals and polycrystalline films to achieve high bulk minority-carrier lifetime and p-type doping. Low-temperature photoluminescence measurements confirm that bulk defect chemistry is altered by inserting intentional extrinsic dopants. Group I dopants such as copper display a tradeoff where increased doping decreases lifetime. By incorporating a Group V dopant source such as phosphorus, bulk lifetime values of 20-40 ns with acceptor density values of 0.7-1.0×1016 cm-3 are obtained in single and polycrystalline CdTe crystals. This exceptional combination of long lifetime and high p-type doping in a manufacturable material provides a path to increase open-circuit voltage, fill factor, and efficiency in CdTe photovoltaic devices.
| Original language | American English |
|---|---|
| Pages | 3258-3260 |
| Number of pages | 3 |
| DOIs | |
| State | Published - 2014 |
| Event | 40th IEEE Photovoltaic Specialist Conference, PVSC 2014 - Denver, United States Duration: 8 Jun 2014 → 13 Jun 2014 |
Conference
| Conference | 40th IEEE Photovoltaic Specialist Conference, PVSC 2014 |
|---|---|
| Country/Territory | United States |
| City | Denver |
| Period | 8/06/14 → 13/06/14 |
Bibliographical note
Publisher Copyright:© 2014 IEEE.
NLR Publication Number
- NREL/CP-5K00-61197
Keywords
- carrier lifetime
- CdTe
- doping
- photovoltaic cells