Abstract
We describe advances on procedures used for the coring of silicon photovoltaic modules. These procedures involve coring specific locations, starting from the back of the modules, and removing selected parts of the cell structure, while preserving the front tempered glass. The standard coring procedures had to be modified from case to case due to the different cell structures and measurement requirements. We provide examples of the characterization of the cored samples by scanning electron microscopy and energy-dispersive X-ray spectroscopy. Finally, we describe a simple process to create small openings at specific locations on the back of photovoltaic modules to allow for efficiency-related measurement of individual cells and groups of cells.
Original language | American English |
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Pages | 1449-1453 |
Number of pages | 5 |
DOIs | |
State | Published - 14 Jun 2020 |
Event | 47th IEEE Photovoltaic Specialists Conference, PVSC 2020 - Calgary, Canada Duration: 15 Jun 2020 → 21 Aug 2020 |
Conference
Conference | 47th IEEE Photovoltaic Specialists Conference, PVSC 2020 |
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Country/Territory | Canada |
City | Calgary |
Period | 15/06/20 → 21/08/20 |
Bibliographical note
See NREL/CP-5K00-76842 for preprintNREL Publication Number
- NREL/CP-5K00-79315
Keywords
- coring
- photovoltaic modules
- silicon