All About PID - Testing and Avoidance in the Field

Research output: Contribution to journalArticle


Potential-induced degradation can cause significant power loss in modules if the appropriate precautions are not taken. In the first part of a new series in PV Tech Power on module failure, Peter Hacke and Steve Johnston assess the current state-of-the-art in detecting, avoiding and mitigating the worst effects of PID.
Original languageAmerican English
Pages (from-to)70-76
Number of pages7
JournalPhotovoltaics International
StatePublished - 2016

NREL Publication Number

  • NREL/JA-5J00-66799


  • IEC 62804-1
  • PID
  • potential-induced degradation test


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