All About PID - Testing and Avoidance in the Field

Peter Hacke; Steven Johnston

All About PID - Testing and Avoidance in the Field

Materials Science

Research output: Contribution to journal › Article

Abstract

Potential-induced degradation can cause significant power loss in modules if the appropriate precautions are not taken. In the first part of a new series in PV Tech Power on module failure, Peter Hacke and Steve Johnston assess the current state-of-the-art in detecting, avoiding and mitigating the worst effects of PID.

Original language	American English
Pages (from-to)	70-76
Number of pages	7
Journal	Photovoltaics International
Volume	33
State	Published - 2016

NREL Publication Number

NREL/JA-5J00-66799

Keywords

IEC 62804-1
PID
potential-induced degradation test

Cite this

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abstract = "Potential-induced degradation can cause significant power loss in modules if the appropriate precautions are not taken. In the first part of a new series in PV Tech Power on module failure, Peter Hacke and Steve Johnston assess the current state-of-the-art in detecting, avoiding and mitigating the worst effects of PID.",

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AU - Hacke, Peter

AU - Johnston, Steven

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AB - Potential-induced degradation can cause significant power loss in modules if the appropriate precautions are not taken. In the first part of a new series in PV Tech Power on module failure, Peter Hacke and Steve Johnston assess the current state-of-the-art in detecting, avoiding and mitigating the worst effects of PID.

KW - IEC 62804-1

KW - PID

KW - potential-induced degradation test

M3 - Article

SN - 8750-1473

VL - 33

SP - 70

EP - 76

JO - Photovoltaics International

JF - Photovoltaics International

ER -

All About PID - Testing and Avoidance in the Field

Abstract

NREL Publication Number

Keywords

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