Abstract
All-back-contact perovskite solar cells promise greater power conversion efficiency compared to conventional planar device architectures. However, the best-performing devices to date use photolithography to fabricate electrodes, which is expensive for deployment and a barrier for research facilities. Herein, we utilize cracked film lithography, a solution-processed micropatterning technique, to form an interconnected, defect-tolerant back-contact electrode network. We introduce a crack widening technique to control the optical transparency and sheet resistance while decoupling the relative areas of the electron and hole contacts in the back-contact network. Wider cracks increase the area of the hole-selective contact, which increases photocurrent and power conversion efficiency.
Original language | American English |
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Pages (from-to) | 9273-9279 |
Number of pages | 7 |
Journal | ACS Applied Energy Materials |
Volume | 5 |
Issue number | 8 |
DOIs | |
State | Published - 2022 |
Bibliographical note
Publisher Copyright:© 2022 American Chemical Society. All rights reserved.
NREL Publication Number
- NREL/JA-5900-82711
Keywords
- all-back-contact
- back-contact electrodes
- cracked-film lithography
- perovskite
- quasi-interdigitated
- scalable fabrication
- solar cells