Alloy Ordering in GaInP Alloys: A Cross-Sectional Scanning Tunneling Microscopy Study

N. Liu, C. K. Shih, J. Geisz, A. Mascarenhas, J. M. Olson

Research output: Contribution to journalArticlepeer-review

30 Scopus Citations

Abstract

We present a cross-sectional scanning tunneling microscopy (XSTM) study of the spontaneous ordering of Ga0.48In0.52P and Ga0.52In0.48P grown on (001) GaAs substrates by molecular beam epitaxy (MBE) and organometallic vapor phase epitaxy (OMVPE), respectively. The (111)-type alloy ordering could be seen clearly in the OMVPE-grown alloy region. On the other hand, the MBE-grown region shows a very small degree of ordering as revealed by the STM. Most of the ordered region shows (InP)1(GaP)1-type ordering: alternating InP- and GaP-like (1̄11) planes. In addition to this type of ordering, we also observe another type of ordering consisting of two InP-like (1̄11) planes and one GaP-like (1̄11) plane that we call (InP)2(GaP)1-type ordering.

Original languageAmerican English
Pages (from-to)1979-1981
Number of pages3
JournalApplied Physics Letters
Volume73
Issue number14
DOIs
StatePublished - 1998

NREL Publication Number

  • NREL/JA-590-26050

Fingerprint

Dive into the research topics of 'Alloy Ordering in GaInP Alloys: A Cross-Sectional Scanning Tunneling Microscopy Study'. Together they form a unique fingerprint.

Cite this