Aluminum Backside Segregation Gettering

    Research output: Contribution to conferencePaper

    Abstract

    Aluminum backside gettering of iron was quantitatively characterized and distinguished from effects of precipitation or back surface fields. It is shown that for high impurity concentrations, precipitation increases minority carrier diffusion lengths. This effect is small compared to the diffusion length increases from aluminum gettering. Segregation coefficients (S) for iron between silicon andthe backside aluminum were found exceeding 10/sup 6/ and there are indications for S up to 10/sup 7/.
    Original languageAmerican English
    Pages441-444
    Number of pages4
    DOIs
    StatePublished - 1996
    EventTwenty Fifth IEEE Photovoltaic Specialists Conference - Washington, D.C.
    Duration: 13 May 199617 May 1996

    Conference

    ConferenceTwenty Fifth IEEE Photovoltaic Specialists Conference
    CityWashington, D.C.
    Period13/05/9617/05/96

    Bibliographical note

    Work performed by the University of California, Berkeley, California

    NREL Publication Number

    • NREL/CP-22382

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