| Original language | American English |
|---|---|
| Pages | 202-205 |
| Number of pages | 4 |
| State | Published - 1997 |
| Event | Seventh Workshop on the Role of Impurities and Defects in Silicon Device Processing - Vail, Colorado Duration: 11 Aug 1997 → 13 Aug 1997 |
Conference
| Conference | Seventh Workshop on the Role of Impurities and Defects in Silicon Device Processing |
|---|---|
| City | Vail, Colorado |
| Period | 11/08/97 → 13/08/97 |
Bibliographical note
Work performed by Duke University, Durham, North CarolinaNREL Publication Number
- NREL/CP-23618