Abstract
The authors present results of the amorphous silicon based alloy film research performed using a capacitively-coupled RF glow-discharge system. They report and contrast the electronic and structural properties of a-SiC:H films produced using hydrogen and fluorine containing gases; and show that either graphitic-type or CH//n -type bonding, which may be present in films deposited from SiH//4 /CH//4 gas mixtures, can be eliminated using SiF//4 /CH//4 /H//2 gas mixtures, with a resultant improvement in photovoltaic response. They also combine photoconductivity and density of states data with device modeling studies to suggest that the nature of the gap states in a-SiGe:H material changes as the bandgap is lowered below 1. 5 eV, thus offering a possible explanation for the sharp drop in photoconductivity observed by many researchers.
Original language | American English |
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Pages | 1513-1518 |
Number of pages | 6 |
State | Published - 1985 |
Event | Eighteenth IEEE Photovoltaic Specialists Conference-1985 - Las Vegas, Nevada Duration: 21 Oct 1985 → 25 Oct 1985 |
Conference
Conference | Eighteenth IEEE Photovoltaic Specialists Conference-1985 |
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City | Las Vegas, Nevada |
Period | 21/10/85 → 25/10/85 |
Bibliographical note
Work performed by Solar Energy Research Institute, Golden, Colorado; Colorado School of Mines, Golden, Colorado; and LPSES CNRS, Valbonne, FranceNREL Publication Number
- ACNR/CP-212-7844