Abstract
Two-dimensional sulfides and their heterostructures have emerged as potentially useful materials for technological applications. Controllable self-assembly of interleaved crystalline heterostructures from designed thin-film precursors has been demonstrated in selenide and telluride chemical systems, but not yet in sulfide chemistries. Preparing such amorphous sulfide heterostructure precursors is a necessary first step toward this goal. Here, deposition of thin-film amorphous precursors for layered sulfide heterostructures by RF sputtering is presented on the example of SnS-MoS2. A calibration process specific to the mechanisms of RF sputtering from sulfide and disulfide compound targets is established. Precursor film structure and composition are confirmed via X-ray reflectivity and Rutherford backscattering measurements. Local nanostructure and composition are also examined by electron microscopy and electron energy loss spectroscopy.
Original language | American English |
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Article number | 051201 |
Number of pages | 8 |
Journal | Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics |
Volume | 37 |
Issue number | 5 |
DOIs | |
State | Published - 1 Sep 2019 |
Bibliographical note
Publisher Copyright:© 2019 Author(s).
NREL Publication Number
- NREL/JA-5K00-73503
Keywords
- electron energy loss spectroscopy
- electron microscopy
- heterostructures
- Rutherford backscattering spectroscopy
- sputter deposition
- sulfur compounds
- thin films