Alternative Method to Determine the Steady State Nucleation Rate in Thermally Annealed HWCVD a-Si:H Films

David Ginley; Bobby To; Matthew Dabney; Philip Parilla; Helio Moutinho; A. Harv Mahan

doi:10.1016/j.tsf.2011.01.332

Alternative Method to Determine the Steady State Nucleation Rate in Thermally Annealed HWCVD a-Si:H Films

David Ginley, Bobby To, Matthew Dabney, Philip Parilla, Helio Moutinho, A. Harv Mahan

National Renewable Energy Laboratory

Research output: Contribution to conference › Paper

Original language	American English
Pages	4455-4458
Number of pages	4
DOIs	https://doi.org/10.1016/j.tsf.2011.01.332
State	Published - 2011
Event	6th International Conference on Hot-Wire CVD (Cat-CVD) Process - Paris, France Duration: 13 Sep 2010 → 17 Sep 2010

Conference

Conference	6th International Conference on Hot-Wire CVD (Cat-CVD) Process
City	Paris, France
Period	13/09/10 → 17/09/10

NREL Publication Number

NREL/CP-5200-49084

Keywords

amorphous silicon
crystallization
nucleation rate
thermal annealing

Access to Document

10.1016/j.tsf.2011.01.332

Cite this

@conference{1c38a7017b884ff8bdb9b78f481f6623,

title = "Alternative Method to Determine the Steady State Nucleation Rate in Thermally Annealed HWCVD a-Si:H Films",

keywords = "amorphous silicon, crystallization, nucleation rate, thermal annealing",

author = "David Ginley and Bobby To and Matthew Dabney and Philip Parilla and Helio Moutinho and Mahan, {A. Harv}",

year = "2011",

doi = "10.1016/j.tsf.2011.01.332",

language = "American English",

pages = "4455--4458",

note = "6th International Conference on Hot-Wire CVD (Cat-CVD) Process ; Conference date: 13-09-2010 Through 17-09-2010",

}

TY - CONF

T1 - Alternative Method to Determine the Steady State Nucleation Rate in Thermally Annealed HWCVD a-Si:H Films

AU - Ginley, David

AU - To, Bobby

AU - Dabney, Matthew

AU - Parilla, Philip

AU - Moutinho, Helio

AU - Mahan, A. Harv

PY - 2011

Y1 - 2011

KW - amorphous silicon

KW - crystallization

KW - nucleation rate

KW - thermal annealing

UR - http://www.scopus.com/inward/record.url?scp=79958839603&partnerID=8YFLogxK

U2 - 10.1016/j.tsf.2011.01.332

DO - 10.1016/j.tsf.2011.01.332

M3 - Paper

SP - 4455

EP - 4458

T2 - 6th International Conference on Hot-Wire CVD (Cat-CVD) Process

Y2 - 13 September 2010 through 17 September 2010

ER -

Alternative Method to Determine the Steady State Nucleation Rate in Thermally Annealed HWCVD a-Si:H Films

Conference

NREL Publication Number

Keywords

Access to Document

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Cite this