An Extended Defect as a Sensor for Free Carrier Diffusion in a Semiconductor: Article No. 012114

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NREL Publication Number

@article{44df1752947d4f6a96a139169fa2bc68,

title = "An Extended Defect as a Sensor for Free Carrier Diffusion in a Semiconductor: Article No. 012114",

author = "NREL",

year = "2013",

doi = "10.1063/1.4775369",

language = "American English",

volume = "102",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "1",

}