Abstract
Spread spectrum time domain reflectometry (SSTDR) is a broadband electrical reflectometry technique that has been used to detect and locate faults on live electrical systems, including photovoltaic systems. In this article, we evaluate the detectability and localizability from both existing literature and our own measurements using SSTDR of open-circuit faults, connection faults, short-circuit faults, ground faults, arc faults, shading faults, bypass diode faults, and accelerated degradation faults in PV cells and mini-modules. Reflection magnitudes for these faults are compared. Preliminary data on buried and grounded PV cable along with arc fault detection are presented.
Original language | American English |
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Article number | 9007610 |
Pages (from-to) | 844-851 |
Number of pages | 8 |
Journal | IEEE Journal of Photovoltaics |
Volume | 10 |
Issue number | 3 |
DOIs | |
State | Published - May 2020 |
Bibliographical note
Publisher Copyright:© 2011-2012 IEEE.
NREL Publication Number
- NREL/JA-5K00-75182
Keywords
- Accelerated degradation faults (ADF)
- arc faults (AF)
- bypass diode faults (BDF)
- connection faults (CF)
- degradation
- ground faults (GF)
- open-circuit (OC) faults
- photovoltaic (PV) cells
- reflectometry
- shading faults
- short-circuit (SC) faults
- spread spectrum time domain reflectometry (SSTDR)