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Analysis and Characterization of Thin Films: A Tutorial
Lawrence L. Kazmerski
Materials Science
Research output
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Contribution to journal
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Article
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peer-review
10
Scopus Citations
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Chemistry
Secondary Ion Mass Spectroscopy
100%
Chemical Element
100%
Depth Profiling
100%
Scanning Tunneling Microscopy
100%
Spectroscopic Imaging
100%
Scanning Auger Electron Spectroscopy
100%
Ion Beam
100%
Electron Beam
100%
X Ray Photoemission Spectroscopy
100%
electronics
100%
Material Science
Surface (Surface Science)
100%
Thin Films
100%
Photovoltaics
66%
Secondary Ion Mass Spectrometry
33%
Analytical Method
33%
Auger Electron Spectroscopy
33%
X-Ray Photoelectron Spectroscopy
33%
Scanning Tunneling Microscopy
33%
Electronic Materials
33%
Spectroscopic Imaging
33%
Earth and Planetary Sciences
Thin Films
100%
Secondary Ion Mass Spectrometry
33%
Spatial Resolution
33%
Real Time
33%
Electronic Material
33%
Ion Beam
33%
Electron Spectroscopy
33%
Photoelectron Spectroscopy
33%
Electron Beam
33%
Chemical Element
33%
X Ray
33%
Engineering
Thin Films
100%
Photovoltaics
66%
Limitations
66%
Ray Photoelectron Spectroscopy
33%
Scanning Tunneling Microscopy
33%
Range Resolution
33%
Spatial Resolution
33%