Analysis of Back-Contact Interface Recombination in Thin-Film Solar Cells

Sanjoy Paul; Sachit Grover; Ingrid L. Repins; Brian M. Keyes; Miguel A. Contreras; Kannan Ramanathan; Rommel Noufi; Zhibo Zhao; Feng Liao; Jian V. Li

doi:10.1109/JPHOTOV.2018.2819664

Analysis of Back-Contact Interface Recombination in Thin-Film Solar Cells

Sanjoy Paul
, Sachit Grover
, Ingrid L. Repins
, Brian M. Keyes
, Miguel A. Contreras
, Kannan Ramanathan
, Rommel Noufi
, Zhibo Zhao
, Feng Liao
, Jian V. Li

Research output: Contribution to journal › Article › peer-review

58 Scopus Citations

Abstract

The open-circuit voltage (V_OC) in a generic TCO/buffer/absorber/back-contact thin-film solar cell device is a key parameter in the recombination analysis. In particular, V_OC is sensitively influenced by the interface recombination at the buffer/absorber front interface and at the absorber/back-contact interface. This paper reports the temperature, excitation light intensity, and wavelength-dependent open-circuit voltage analysis to separate and quantify recombination rates in solar cells at the front and back interfaces, in the depletion regions, and in the quasi-neutral region. The wavelength-dependent V_OC analysis is exploited to extract the absorber/back-contact recombination coefficient. The experimentally observed results are verified using SCAPS-1D (one dimensional - a solar cell capacitance simulator) simulation.

Original language	American English
Pages (from-to)	871-878
Number of pages	8
Journal	IEEE Journal of Photovoltaics
Volume	8
Issue number	3
DOIs	https://doi.org/10.1109/JPHOTOV.2018.2819664 https://doi.org/10.1109/JPHOTOV.2018.2819664
State	Published - 2018

Bibliographical note

Publisher Copyright:
© 2011-2012 IEEE.

NLR Publication Number

NREL/JA-5K00-72052

Keywords

Back-contact
interface
open-circuit voltage
photovoltaics
recombination
SCAPS-1D

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@article{a553324f4b37478f9e8e4c5e1382eb86,

title = "Analysis of Back-Contact Interface Recombination in Thin-Film Solar Cells",

abstract = "The open-circuit voltage (VOC) in a generic TCO/buffer/absorber/back-contact thin-film solar cell device is a key parameter in the recombination analysis. In particular, VOC is sensitively influenced by the interface recombination at the buffer/absorber front interface and at the absorber/back-contact interface. This paper reports the temperature, excitation light intensity, and wavelength-dependent open-circuit voltage analysis to separate and quantify recombination rates in solar cells at the front and back interfaces, in the depletion regions, and in the quasi-neutral region. The wavelength-dependent VOC analysis is exploited to extract the absorber/back-contact recombination coefficient. The experimentally observed results are verified using SCAPS-1D (one dimensional - a solar cell capacitance simulator) simulation.",

keywords = "Back-contact, interface, open-circuit voltage, photovoltaics, recombination, SCAPS-1D",

author = "Sanjoy Paul and Sachit Grover and Repins, \{Ingrid L.\} and Keyes, \{Brian M.\} and Contreras, \{Miguel A.\} and Kannan Ramanathan and Rommel Noufi and Zhibo Zhao and Feng Liao and Li, \{Jian V.\}",

note = "Publisher Copyright: {\textcopyright} 2011-2012 IEEE.",

year = "2018",

doi = "10.1109/JPHOTOV.2018.2819664",

language = "American English",

volume = "8",

pages = "871--878",

journal = "IEEE Journal of Photovoltaics",

issn = "2156-3381",

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TY - JOUR

T1 - Analysis of Back-Contact Interface Recombination in Thin-Film Solar Cells

AU - Paul, Sanjoy

AU - Grover, Sachit

AU - Repins, Ingrid L.

AU - Keyes, Brian M.

AU - Contreras, Miguel A.

AU - Ramanathan, Kannan

AU - Noufi, Rommel

AU - Zhao, Zhibo

AU - Liao, Feng

AU - Li, Jian V.

PY - 2018

Y1 - 2018

N2 - The open-circuit voltage (VOC) in a generic TCO/buffer/absorber/back-contact thin-film solar cell device is a key parameter in the recombination analysis. In particular, VOC is sensitively influenced by the interface recombination at the buffer/absorber front interface and at the absorber/back-contact interface. This paper reports the temperature, excitation light intensity, and wavelength-dependent open-circuit voltage analysis to separate and quantify recombination rates in solar cells at the front and back interfaces, in the depletion regions, and in the quasi-neutral region. The wavelength-dependent VOC analysis is exploited to extract the absorber/back-contact recombination coefficient. The experimentally observed results are verified using SCAPS-1D (one dimensional - a solar cell capacitance simulator) simulation.

AB - The open-circuit voltage (VOC) in a generic TCO/buffer/absorber/back-contact thin-film solar cell device is a key parameter in the recombination analysis. In particular, VOC is sensitively influenced by the interface recombination at the buffer/absorber front interface and at the absorber/back-contact interface. This paper reports the temperature, excitation light intensity, and wavelength-dependent open-circuit voltage analysis to separate and quantify recombination rates in solar cells at the front and back interfaces, in the depletion regions, and in the quasi-neutral region. The wavelength-dependent VOC analysis is exploited to extract the absorber/back-contact recombination coefficient. The experimentally observed results are verified using SCAPS-1D (one dimensional - a solar cell capacitance simulator) simulation.

KW - Back-contact

KW - interface

KW - open-circuit voltage

KW - photovoltaics

KW - recombination

KW - SCAPS-1D

UR - https://www.scopus.com/pages/publications/85046122222

U2 - 10.1109/JPHOTOV.2018.2819664

DO - 10.1109/JPHOTOV.2018.2819664

M3 - Article

AN - SCOPUS:85046122222

SN - 2156-3381

VL - 8

SP - 871

EP - 878

JO - IEEE Journal of Photovoltaics

JF - IEEE Journal of Photovoltaics

IS - 3

ER -

Analysis of Back-Contact Interface Recombination in Thin-Film Solar Cells

Abstract

Bibliographical note

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Keywords

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