Analysis of Emission Rate Measurements in a Material Showing a Meyer-Neldel Rule

Analysis of Emission Rate Measurements in a Material Showing a Meyer-Neldel Rule

NREL

Research output: Contribution to conference › Paper

Original language	American English
Pages	9-17
Number of pages	9
State	Published - 2004
Event	Progress in Compound Semiconductor Materials III Electronic and Optoelectronic Applications: Materials Research Society Symposium - Boston, Massachusetts Duration: 1 Dec 2003 → 4 Dec 2003

Conference

Conference	Progress in Compound Semiconductor Materials III Electronic and Optoelectronic Applications: Materials Research Society Symposium
City	Boston, Massachusetts
Period	1/12/03 → 4/12/03

NLR Publication Number

NREL/CP-520-37302

Cite this

@conference{662c5931e8ef47b8af7216f0989a3ac0,

title = "Analysis of Emission Rate Measurements in a Material Showing a Meyer-Neldel Rule",

author = "NREL",

year = "2004",

language = "American English",

pages = "9--17",

note = "Progress in Compound Semiconductor Materials III Electronic and Optoelectronic Applications: Materials Research Society Symposium ; Conference date: 01-12-2003 Through 04-12-2003",

}