Analytical Microscopy

    Research output: NRELBrochure


    In the Analytical Microscopy group, within the National Center for Photovoltaic?s Measurements and Characterization Division, we combine two complementary areas of analytical microscopy--electron microscopy and proximal-probe techniques--and use a variety of state-of-the-art imaging and analytical tools. We also design and build custom instrumentation and develop novel techniques that provideunique capabilities for studying materials and devices. In our work, we collaborate with you to solve materials- and device-related R&D problems. This sheet summarizes the uses and features of four major tools: transmission electron microscopy, scanning electron microscopy, the dual-beam focused-ion-beam workstation, and scanning probe microscopy.
    Original languageAmerican English
    Number of pages4
    StatePublished - 2006

    NREL Publication Number

    • NREL/BR-520-40120


    • analytical microscopy
    • capabilities
    • measurements and characterization
    • NCPV
    • NREL
    • techniques


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