Abstract
This brochure presents the capabilities that the Measurements and Characterization Division has in Analytical Microscopy, in which a variety of sophisticated techniques are used to study a material's topographical, crystallographic, structural, chemical, and luminescence properties.
| Original language | American English |
|---|---|
| Number of pages | 8 |
| State | Published - 2000 |
NREL Publication Number
- NREL/BR-530-22212