Apparatus and Methods of Measuring Minority Carrier Lifetime using a Liquid Probe

NREL (Inventor)

    Research output: Patent


    Methods and apparatus for measuring minority carrier lifetimes using liquid probes are provided. In one embodiment, a method of measuring the minority carrier lifetime of a semiconductor material comprises: providing a semiconductor material having a surface; forming a rectifying junction at a first location on the surface by temporarily contacting the surface with a conductive liquid probe; electrically coupling a second junction to the semiconductor material at a second location, wherein the first location and the second location are physically separated; applying a forward bias to the rectifying junction causing minority carrier injection in the semiconductor material; measuring a total capacitance as a function of frequency between the rectifying junction and the second junction; determining an inflection frequency of the total capacitance; and determining a minority lifetime of the semiconductor material from the inflection frequency.
    Original languageAmerican English
    Patent number9,310,396
    Filing date12/04/16
    StatePublished - 2016

    NREL Publication Number

    • NREL/PT-5J00-66452


    • liquid probes
    • minority carrier lifetimes
    • semiconductor materials


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