Application of Synchrotron Radiation Based X-ray Microprobe Techniques for the Analysis of Recombination Activity of Metals Precipitated at Si/SiGe Misfit Dislocations

Application of Synchrotron Radiation Based X-ray Microprobe Techniques for the Analysis of Recombination Activity of Metals Precipitated at Si/SiGe Misfit Dislocations

Research output: Contribution to conference › Paper

Original language	American English
Pages	110-115
Number of pages	6
State	Published - 2002
Event	12th Workshop on Crystalline Silicon Solar Cell Materials and Processes - Breckenridge, Colorado Duration: 11 Aug 2002 → 14 Aug 2002

Conference

Conference	12th Workshop on Crystalline Silicon Solar Cell Materials and Processes
City	Breckenridge, Colorado
Period	11/08/02 → 14/08/02

Bibliographical note

Work performed by University of California, Berkeley, California and IHP, Frankfurt, Germany

NREL Publication Number

NREL/CP-520-35674

Cite this

@conference{b21325114a004e748c0c9ac9dd860bda,

title = "Application of Synchrotron Radiation Based X-ray Microprobe Techniques for the Analysis of Recombination Activity of Metals Precipitated at Si/SiGe Misfit Dislocations",

author = "NREL",

note = "Work performed by University of California, Berkeley, California and IHP, Frankfurt, Germany; 12th Workshop on Crystalline Silicon Solar Cell Materials and Processes ; Conference date: 11-08-2002 Through 14-08-2002",

year = "2002",

language = "American English",

pages = "110--115",

}

TY - CONF

T1 - Application of Synchrotron Radiation Based X-ray Microprobe Techniques for the Analysis of Recombination Activity of Metals Precipitated at Si/SiGe Misfit Dislocations

AU - NREL, null

N1 - Work performed by University of California, Berkeley, California and IHP, Frankfurt, Germany

PY - 2002

Y1 - 2002

M3 - Paper

SP - 110

EP - 115

T2 - 12th Workshop on Crystalline Silicon Solar Cell Materials and Processes

Y2 - 11 August 2002 through 14 August 2002

ER -