Application of X-Ray Fluorescence Technique to Studies of Aluminum Gettering in Silicon

Application of X-Ray Fluorescence Technique to Studies of Aluminum Gettering in Silicon

Research output: Contribution to conference › Paper

Original language	American English
Pages	263-266
Number of pages	4
State	Published - 2002
Event	12th Workshop on Crystalline Silicon Solar Cell Materials and Processes - Breckenridge, Colorado Duration: 11 Aug 2002 → 14 Aug 2002

Conference

Conference	12th Workshop on Crystalline Silicon Solar Cell Materials and Processes
City	Breckenridge, Colorado
Period	11/08/02 → 14/08/02

Bibliographical note

Work performed by University of California, Berkeley, California

NREL Publication Number

NREL/CP-520-35679

Cite this

@conference{0a0a5de50be44611916be95d6edec216,

title = "Application of X-Ray Fluorescence Technique to Studies of Aluminum Gettering in Silicon",

author = "NREL",

note = "Work performed by University of California, Berkeley, California; 12th Workshop on Crystalline Silicon Solar Cell Materials and Processes ; Conference date: 11-08-2002 Through 14-08-2002",

year = "2002",

language = "American English",

pages = "263--266",

}