Applications of Admittance Spectroscopy in Photovoltaic Devices Beyond Majority-Carrier Trapping Defects

R.S. Crandall; Dean Levi; Ingrid Repins; Alexandre Nardes

doi:10.1109/pvsc.2011.6185849

Applications of Admittance Spectroscopy in Photovoltaic Devices Beyond Majority-Carrier Trapping Defects

R.S. Crandall, Dean Levi, Ingrid Repins, Alexandre Nardes

National Renewable Energy Laboratory

Research output: Contribution to conference › Paper

Original language	American English
Pages	000075-000078
Number of pages	4
DOIs	https://doi.org/10.1109/pvsc.2011.6185849
State	Published - 2011
Event	37th IEEE Photovoltaic Specialists Conference (PVSC '11) - Seattle, Washington Duration: 19 Jun 2011 → 24 Jun 2011

Conference

Conference	37th IEEE Photovoltaic Specialists Conference (PVSC '11)
City	Seattle, Washington
Period	19/06/11 → 24/06/11

Bibliographical note

See NREL/CP-5200-50697 for preprint

NREL Publication Number

NREL/CP-5200-55735

Access to Document

10.1109/pvsc.2011.6185849

Cite this

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title = "Applications of Admittance Spectroscopy in Photovoltaic Devices Beyond Majority-Carrier Trapping Defects",

author = "R.S. Crandall and Dean Levi and Ingrid Repins and Alexandre Nardes",

note = "See NREL/CP-5200-50697 for preprint; 37th IEEE Photovoltaic Specialists Conference (PVSC '11) ; Conference date: 19-06-2011 Through 24-06-2011",

year = "2011",

doi = "10.1109/pvsc.2011.6185849",

language = "American English",

pages = "000075--000078",

}

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T1 - Applications of Admittance Spectroscopy in Photovoltaic Devices Beyond Majority-Carrier Trapping Defects

AU - Crandall, R.S.

AU - Levi, Dean

AU - Repins, Ingrid

AU - Nardes, Alexandre

N1 - See NREL/CP-5200-50697 for preprint

PY - 2011

Y1 - 2011

UR - http://www.scopus.com/inward/record.url?scp=84861023213&partnerID=8YFLogxK

U2 - 10.1109/pvsc.2011.6185849

DO - 10.1109/pvsc.2011.6185849

M3 - Paper

SP - 75

EP - 78

T2 - 37th IEEE Photovoltaic Specialists Conference (PVSC '11)

Y2 - 19 June 2011 through 24 June 2011

ER -

Applications of Admittance Spectroscopy in Photovoltaic Devices Beyond Majority-Carrier Trapping Defects

Conference

Bibliographical note

NREL Publication Number

Access to Document

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Fingerprint

Cite this