Applications of Imaging Techniques to Si, Cu(In,Ga)Se2, and CdTe and Correlation to Solar Cell Parameters

Nathan Call; Kim Jones; Rajalakshmi Sundaramoorthy; Bobby To

doi:10.1109/PVSC.2010.5616123

Applications of Imaging Techniques to Si, Cu(In,Ga)Se2, and CdTe and Correlation to Solar Cell Parameters

Nathan Call, Kim Jones, Rajalakshmi Sundaramoorthy, Bobby To

Materials Science

National Renewable Energy Laboratory

Research output: Contribution to conference › Paper

Original language	American English
Pages	001727-001732
Number of pages	6
DOIs	https://doi.org/10.1109/PVSC.2010.5616123
State	Published - 2010
Event	35th IEEE Photovoltaic Specialists Conference (PVSC '10) - Honolulu, Hawaii Duration: 20 Jun 2010 → 25 Jun 2010

Conference

Conference	35th IEEE Photovoltaic Specialists Conference (PVSC '10)
City	Honolulu, Hawaii
Period	20/06/10 → 25/06/10

NREL Publication Number

NREL/CP-520-47702

Keywords

defects
imaging techniques
solar cells

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10.1109/PVSC.2010.5616123

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title = "Applications of Imaging Techniques to Si, Cu(In,Ga)Se2, and CdTe and Correlation to Solar Cell Parameters",

keywords = "defects, imaging techniques, solar cells",

author = "Nathan Call and Kim Jones and Rajalakshmi Sundaramoorthy and Bobby To",

year = "2010",

doi = "10.1109/PVSC.2010.5616123",

language = "American English",

pages = "001727--001732",

note = "35th IEEE Photovoltaic Specialists Conference (PVSC '10) ; Conference date: 20-06-2010 Through 25-06-2010",

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TY - CONF

T1 - Applications of Imaging Techniques to Si, Cu(In,Ga)Se2, and CdTe and Correlation to Solar Cell Parameters

AU - Call, Nathan

AU - Jones, Kim

AU - Sundaramoorthy, Rajalakshmi

AU - To, Bobby

PY - 2010

Y1 - 2010

KW - defects

KW - imaging techniques

KW - solar cells

UR - http://www.scopus.com/inward/record.url?scp=78650104995&partnerID=8YFLogxK

U2 - 10.1109/PVSC.2010.5616123

DO - 10.1109/PVSC.2010.5616123

M3 - Paper

SP - 1727

EP - 1732

T2 - 35th IEEE Photovoltaic Specialists Conference (PVSC '10)

Y2 - 20 June 2010 through 25 June 2010

ER -

Applications of Imaging Techniques to Si, Cu(In,Ga)Se2, and CdTe and Correlation to Solar Cell Parameters

Conference

NREL Publication Number

Keywords

Access to Document

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Cite this