Abstract
Characterization is one important component of the photovoltaics research and development effort. It has supported the evolution of the technology, and measurement techniques have evolved in response to the technology's needs. This paper highlights some important evaluation and verification techniques, covering macroscale through microscale characterization methods. Some emphasis is placed upon the nanoscale regime, in which the characterization and processing of semiconductors is leading to areas of atomic engineering of materials.
| Original language | American English |
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| Pages | 1-7 |
| Number of pages | 7 |
| State | Published - 1993 |
| Event | Proceedings of the 23rd IEEE Photovoltaic Specialists Conference - Louisville, KY, USA Duration: 10 May 1993 → 14 May 1993 |
Conference
| Conference | Proceedings of the 23rd IEEE Photovoltaic Specialists Conference |
|---|---|
| City | Louisville, KY, USA |
| Period | 10/05/93 → 14/05/93 |
NREL Publication Number
- ACNR/CP-16311