Artifact-Free Coring Procedures for Removing Samples from Photovoltaic Modules for Microscopic Analysis

Helio Moutinho; Bobby To; Chun Sheng Jiang; Chuanxiao Xiao; Christopher Muzzillo; Peter Hacke; John Moseley; Gerald Tynan; Lorelle Mansfield; Mowafak Al-Jassim; Steven Johnston; N. Dhere

doi:10.1109/PVSC.2018.8547640

Artifact-Free Coring Procedures for Removing Samples from Photovoltaic Modules for Microscopic Analysis

Helio Moutinho, Bobby To, Chun Sheng Jiang, Chuanxiao Xiao, Christopher Muzzillo, Peter Hacke, John Moseley, Gerald Tynan, Lorelle Mansfield, Mowafak Al-Jassim, Steven Johnston, N. Dhere

University of Central Florida

Research output: Contribution to conference › Paper › peer-review

8 Scopus Citations

Abstract

An important step in producing more reliable and efficient photovoltaic modules is to establish a relationship between the microscopic properties of modules deployed in the field for many years and efficiency-related parameters. The first step in accomplishing this task is to be able to identify and remove small areas from these modules without causing any damage to these samples. In this work, we will describe two different procedures to core small areas of deployed and stressed solar panels produced with different materials (Si, CIGS, and CdTe), and we will prove that these processes did not damage the cored material. We will also show that the coring procedure changes for different types of photovoltaic modules.

Original language	American English
Pages	1313-1317
Number of pages	5
DOIs	https://doi.org/10.1109/PVSC.2018.8547640 https://doi.org/10.1109/PVSC.2018.8547640
State	Published - 26 Nov 2018
Event	7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018 - Waikoloa Village, United States Duration: 10 Jun 2018 → 15 Jun 2018

Conference

Conference	7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018
Country/Territory	United States
City	Waikoloa Village
Period	10/06/18 → 15/06/18

Bibliographical note

Publisher Copyright:
© 2018 IEEE.

NREL Publication Number

NREL/CP-5K00-71616

Keywords

CdTe
CIGS
Coring
photovoltaic modules
Si

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

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Moutinho, H., To, B., Jiang, C. S., Xiao, C., Muzzillo, C., Hacke, P., Moseley, J., Tynan, G., Mansfield, L., Al-Jassim, M., Johnston, S., & Dhere, N. (2018). Artifact-Free Coring Procedures for Removing Samples from Photovoltaic Modules for Microscopic Analysis. 1313-1317. Paper presented at 7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018, Waikoloa Village, United States. https://doi.org/10.1109/PVSC.2018.8547640, https://doi.org/10.1109/PVSC.2018.8547640

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author = "Helio Moutinho and Bobby To and Jiang, {Chun Sheng} and Chuanxiao Xiao and Christopher Muzzillo and Peter Hacke and John Moseley and Gerald Tynan and Lorelle Mansfield and Mowafak Al-Jassim and Steven Johnston and N. Dhere",

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doi = "10.1109/PVSC.2018.8547640",

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Moutinho, H, To, B, Jiang, CS, Xiao, C, Muzzillo, C , Hacke, P, Moseley, J, Tynan, G, Mansfield, L , Al-Jassim, M , Johnston, S & Dhere, N 2018, 'Artifact-Free Coring Procedures for Removing Samples from Photovoltaic Modules for Microscopic Analysis', Paper presented at 7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018, Waikoloa Village, United States, 10/06/18 - 15/06/18 pp. 1313-1317. https://doi.org/10.1109/PVSC.2018.8547640, https://doi.org/10.1109/PVSC.2018.8547640

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T1 - Artifact-Free Coring Procedures for Removing Samples from Photovoltaic Modules for Microscopic Analysis

AU - Moutinho, Helio

AU - To, Bobby

AU - Jiang, Chun Sheng

AU - Xiao, Chuanxiao

AU - Muzzillo, Christopher

AU - Hacke, Peter

AU - Moseley, John

AU - Tynan, Gerald

AU - Mansfield, Lorelle

AU - Al-Jassim, Mowafak

AU - Johnston, Steven

AU - Dhere, N.

PY - 2018/11/26

Y1 - 2018/11/26

N2 - An important step in producing more reliable and efficient photovoltaic modules is to establish a relationship between the microscopic properties of modules deployed in the field for many years and efficiency-related parameters. The first step in accomplishing this task is to be able to identify and remove small areas from these modules without causing any damage to these samples. In this work, we will describe two different procedures to core small areas of deployed and stressed solar panels produced with different materials (Si, CIGS, and CdTe), and we will prove that these processes did not damage the cored material. We will also show that the coring procedure changes for different types of photovoltaic modules.

AB - An important step in producing more reliable and efficient photovoltaic modules is to establish a relationship between the microscopic properties of modules deployed in the field for many years and efficiency-related parameters. The first step in accomplishing this task is to be able to identify and remove small areas from these modules without causing any damage to these samples. In this work, we will describe two different procedures to core small areas of deployed and stressed solar panels produced with different materials (Si, CIGS, and CdTe), and we will prove that these processes did not damage the cored material. We will also show that the coring procedure changes for different types of photovoltaic modules.

KW - CdTe

KW - CIGS

KW - Coring

KW - photovoltaic modules

KW - Si

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DO - 10.1109/PVSC.2018.8547640

M3 - Paper

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T2 - 7th IEEE World Conference on Photovoltaic Energy Conversion, WCPEC 2018

Y2 - 10 June 2018 through 15 June 2018

ER -

Artifact-Free Coring Procedures for Removing Samples from Photovoltaic Modules for Microscopic Analysis

Abstract

Conference

Bibliographical note

NREL Publication Number

Keywords

UN SDGs

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