Atomic-Level Imaging and Microanalysis of Grain Boundaries in Polycrystalline Semiconductors

    Research output: Chapter in Book/Report/Conference proceedingChapter

    Original languageAmerican English
    Title of host publicationPolycrystalline Semiconductors
    Subtitle of host publicationSpringer Proceedings in Physics, Vol. 35
    EditorsJ. H. Werner, H. J. Moller, H. P. Strunk
    StatePublished - 1989

    NREL Publication Number

    • ACNR/CH-213-11546

    Cite this