Atomic-Level Imaging and Microanalysis of Grain Boundaries in Polycrystalline Semiconductors

Research output: Chapter in Book/Report/Conference proceeding › Chapter

Original language	American English
Title of host publication	Polycrystalline Semiconductors
Subtitle of host publication	Springer Proceedings in Physics, Vol. 35
Editors	J. H. Werner, H. J. Moller, H. P. Strunk
Pages	96-107
DOIs	https://doi.org/10.1007/978-3-642-93413-1_13
State	Published - 1989

NLR Publication Number

@inbook{94bb6bfdfdc447dd82e0b063d4529f44,

title = "Atomic-Level Imaging and Microanalysis of Grain Boundaries in Polycrystalline Semiconductors",

author = "NREL",

year = "1989",

doi = "10.1007/978-3-642-93413-1\_13",

language = "American English",

pages = "96--107",

editor = "Werner, \{J. H.\} and Moller, \{H. J.\} and Strunk, \{H. P.\}",

booktitle = "Polycrystalline Semiconductors",

}