Atomic Scale Characterization of Compound Semiconductors using Atom Probe Tomography: Preprint

Research output: Contribution to conferencePaper

Abstract

Internal interfaces are critical in determining the performance of III-V multijunction solar cells. Studying these interfaces with atomic resolution using a combination of transmission electron microscopy (TEM), atom probe tomography (APT), and density functional calculations enables a more fundamental understanding of carrier dynamics in photovoltaic (PV) device structures. To achieve fullatomic scale spatial and chemical resolution, data acquisition parameters in laser pulsed APT must be carefully studied to eliminate surface diffusion. Atom probe data with minimized group V ion clustering and expected stoichiometry can be achieved by adjusting laser pulse power, pulse repetition rate, and specimen preparation parameters such that heat flow away from the evaporating surface ismaximized. Applying these improved analysis conditions to III-V based PV gives an atomic scale understanding of compositional and dopant profiles across interfaces and tunnel junctions and the initial stages of alloy clustering and dopant accumulation. Details on APT experimental methods and future in-situ instrumentation developments are illustrated.
Original languageAmerican English
Number of pages5
StatePublished - 2011
Event37th IEEE Photovoltaic Specialists Conference (PVSC 37) - Seattle, Washington
Duration: 19 Jun 201124 Jun 2011

Conference

Conference37th IEEE Photovoltaic Specialists Conference (PVSC 37)
CitySeattle, Washington
Period19/06/1124/06/11

NREL Publication Number

  • NREL/CP-5200-50730

Keywords

  • atomic scale characterization
  • III-V
  • multijunction
  • PV
  • solar cells

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