Automated Screening for Severe Shunting Defects in Encapsulated Series-Connected Modules

Ingrid Eisgruber, Rick Matson, T. J. McMahon

Research output: Contribution to conferencePaperpeer-review

Abstract

A new technique has been developed for the automated screening of series-connected modules for severe shunting defects, using large-scale laser scanning. The technique is used to quickly locate and quantify shunting defects in encapsulated modules. All cells with a shunt resistance less than the operator-specified threshold are identified, and their shunt resistance is estimated. A signal map of each faulty cell - often sufficient to locate the shunts - is generated. Access to the two module terminals is the only electrical probing required. The technique is fast, nondestructive, equally successful for single-junction and multijunction cells, and requires operator intervention only when mounting the module in the measurement system. The measurement is available for the photovoltaics community through the National Renewable Energy Laboratory.

Original languageAmerican English
Pages727-730
Number of pages4
DOIs
StatePublished - 1997
Externally publishedYes
EventProceedings of the 1997 IEEE 26th Photovoltaic Specialists Conference - Anaheim, CA, USA
Duration: 29 Sep 19973 Oct 1997

Conference

ConferenceProceedings of the 1997 IEEE 26th Photovoltaic Specialists Conference
CityAnaheim, CA, USA
Period29/09/973/10/97

NREL Publication Number

  • NREL/CP-520-23459

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