Automated Screening for Severe Shunting Defects in Encapsulated Series-Connected Modules

Ingrid Eisgruber; Rick Matson; T. J. McMahon

doi:10.1109/PVSC.1997.654192

Automated Screening for Severe Shunting Defects in Encapsulated Series-Connected Modules

Ingrid Eisgruber, Rick Matson, T. J. McMahon

National Renewable Energy Laboratory

Research output: Contribution to conference › Paper › peer-review

Abstract

A new technique has been developed for the automated screening of series-connected modules for severe shunting defects, using large-scale laser scanning. The technique is used to quickly locate and quantify shunting defects in encapsulated modules. All cells with a shunt resistance less than the operator-specified threshold are identified, and their shunt resistance is estimated. A signal map of each faulty cell - often sufficient to locate the shunts - is generated. Access to the two module terminals is the only electrical probing required. The technique is fast, nondestructive, equally successful for single-junction and multijunction cells, and requires operator intervention only when mounting the module in the measurement system. The measurement is available for the photovoltaics community through the National Renewable Energy Laboratory.

Original language	American English
Pages	727-730
Number of pages	4
DOIs	https://doi.org/10.1109/PVSC.1997.654192
State	Published - 1997
Event	Proceedings of the 1997 IEEE 26th Photovoltaic Specialists Conference - Anaheim, CA, USA Duration: 29 Sep 1997 → 3 Oct 1997

Conference

Conference	Proceedings of the 1997 IEEE 26th Photovoltaic Specialists Conference
City	Anaheim, CA, USA
Period	29/09/97 → 3/10/97

NREL Publication Number

NREL/CP-520-23459

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10.1109/PVSC.1997.654192

Cite this

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title = "Automated Screening for Severe Shunting Defects in Encapsulated Series-Connected Modules",

abstract = "A new technique has been developed for the automated screening of series-connected modules for severe shunting defects, using large-scale laser scanning. The technique is used to quickly locate and quantify shunting defects in encapsulated modules. All cells with a shunt resistance less than the operator-specified threshold are identified, and their shunt resistance is estimated. A signal map of each faulty cell - often sufficient to locate the shunts - is generated. Access to the two module terminals is the only electrical probing required. The technique is fast, nondestructive, equally successful for single-junction and multijunction cells, and requires operator intervention only when mounting the module in the measurement system. The measurement is available for the photovoltaics community through the National Renewable Energy Laboratory.",

author = "Ingrid Eisgruber and Rick Matson and McMahon, {T. J.}",

year = "1997",

doi = "10.1109/PVSC.1997.654192",

language = "American English",

pages = "727--730",

note = "Proceedings of the 1997 IEEE 26th Photovoltaic Specialists Conference ; Conference date: 29-09-1997 Through 03-10-1997",

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T1 - Automated Screening for Severe Shunting Defects in Encapsulated Series-Connected Modules

AU - Eisgruber, Ingrid

AU - Matson, Rick

AU - McMahon, T. J.

PY - 1997

Y1 - 1997

N2 - A new technique has been developed for the automated screening of series-connected modules for severe shunting defects, using large-scale laser scanning. The technique is used to quickly locate and quantify shunting defects in encapsulated modules. All cells with a shunt resistance less than the operator-specified threshold are identified, and their shunt resistance is estimated. A signal map of each faulty cell - often sufficient to locate the shunts - is generated. Access to the two module terminals is the only electrical probing required. The technique is fast, nondestructive, equally successful for single-junction and multijunction cells, and requires operator intervention only when mounting the module in the measurement system. The measurement is available for the photovoltaics community through the National Renewable Energy Laboratory.

AB - A new technique has been developed for the automated screening of series-connected modules for severe shunting defects, using large-scale laser scanning. The technique is used to quickly locate and quantify shunting defects in encapsulated modules. All cells with a shunt resistance less than the operator-specified threshold are identified, and their shunt resistance is estimated. A signal map of each faulty cell - often sufficient to locate the shunts - is generated. Access to the two module terminals is the only electrical probing required. The technique is fast, nondestructive, equally successful for single-junction and multijunction cells, and requires operator intervention only when mounting the module in the measurement system. The measurement is available for the photovoltaics community through the National Renewable Energy Laboratory.

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DO - 10.1109/PVSC.1997.654192

M3 - Paper

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EP - 730

T2 - Proceedings of the 1997 IEEE 26th Photovoltaic Specialists Conference

Y2 - 29 September 1997 through 3 October 1997

ER -

Automated Screening for Severe Shunting Defects in Encapsulated Series-Connected Modules

Abstract

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NREL Publication Number

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