Abstract
ZnO:N films were deposited by reactive RF magnetron sputtering in mixed N2 and O2 gas ambient. Their PEC properties were measured and compared with those of as-grown and annealed ZnO films. The ZnO:N films exhibit photoresponse in the visible-light region, yielding higher total currents than pure ZnO thin films. With combined ultraviolet/infrared and color filtering, our data indicate that the main contribution to the high photocurrent is from the absorption of light in long-wavelength regions. Our results demonstrate that N incorporation in ZnO can narrow the bandgap and create absorption in the visible-light region for ZnO films, suggesting that N incorporation could be a potential method to improve the efficiency of PEC water splitting using ZnO-based materials.
Original language | American English |
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Pages | 952-961 |
Number of pages | 10 |
State | Published - 2008 |
Event | Materials Science and Technology Conference and Exhibition, MS and T'08 - Pittsburgh, PA, United States Duration: 5 Oct 2008 → 9 Oct 2008 |
Conference
Conference | Materials Science and Technology Conference and Exhibition, MS and T'08 |
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Country/Territory | United States |
City | Pittsburgh, PA |
Period | 5/10/08 → 9/10/08 |
NREL Publication Number
- NREL/CP-520-43604
Keywords
- bandgap
- crystallinity
- gas ambient
- photoelectrochemical
- RF power
- sputter
- visible light
- ZnO