Abstract
We used the deep-level transient spectroscopy (DLTS) to investigate the electronic properties of p-type CuInSe2 (CIS) polycrystalline thin-film solar cells. We detected electron (or minority) traps with activation energies ranging from Ec-0.1 to Ec-0.22 eV (where E c is the energy of electrons at the conduction band minimum). While varying the filling pulse duration, we observed the gradual increase in the amplitude of the DLTS signal for these states until it apparently saturates at a pulse duration ∼1 s. Increasing the duration of the filling pulse also results in broadening the DLTS signals and shifting the maximum of these signals towards lower temperature, whereas the high-temperature sides coincide. We also detected a hole (or majority) trap around a temperature of 190 K. Using a model that allows us to distinguish between bandlike states and localized ones based on the dependence of the shape of their DLTS-signal on the filling-pulse duration, we relate the electron trap to bandlike states and the hole trap to localized ones.
Original language | American English |
---|---|
Pages (from-to) | 1855-1857 |
Number of pages | 3 |
Journal | Journal of Physics and Chemistry of Solids |
Volume | 66 |
Issue number | 11 |
DOIs | |
State | Published - 2005 |
NREL Publication Number
- NREL/JA-520-40244
Keywords
- A. Copper indium diselenide
- A. CuInSe
- A. Thin films
- C. Deep-level transient spectroscopy
- D. Electrical properties