Abstract
Two distinctive regimes of behavior are observed from GaP1- x - y Bi x N y alloys with x < 2.4%, y < 3.4% grown by molecular beam epitaxy. These regimes are correlated with abundant bismuth interstitial impurities that are encouraged or suppressed according to the sample growth temperature, with up to 55% of incorporated bismuth located interstitially. When bismuth interstitials are present, radiative recombination arises at near-band-edge localized states rather than from impurity bands and deep state luminescence. This change demonstrates a novel strategy for controlling luminescence in isoelectronic semiconductor alloys and is attributed to a disruption of carrier transfer processes.
| Original language | American English |
|---|---|
| Article number | 111201 |
| Number of pages | 6 |
| Journal | Japanese Journal of Applied Physics, Part 2: Letters |
| Volume | 56 |
| Issue number | 11 |
| DOIs | |
| State | Published - 2017 |
Bibliographical note
Publisher Copyright:© 2017 The Japan Society of Applied Physics.
NREL Publication Number
- NREL/JA-5K00-70115
Keywords
- bismide
- impurities
- semiconductors