Calibration and Rating of Photovoltaics

Keith Emery

doi:10.1109/PVSC.2012.6317717

Calibration and Rating of Photovoltaics

Keith Emery

Chemistry and Nanoscience

Research output: Contribution to conference › Paper › peer-review

5 Scopus Citations

Abstract

Rating the performance of photovoltaic (PV) modules is critical to determining the cost per watt, and efficiency is useful to assess the relative progress among PV concepts. Procedures for determining the efficiency for PV technologies from 1-sun to low concentration to high concentration are discussed. We also discuss the state of the art in primary and secondary calibration of PV reference cells used by calibration laboratories around the world. Finally, we consider challenges to rating PV technologies and areas for improvement.

Original language	American English
Pages	769-774
Number of pages	6
DOIs	https://doi.org/10.1109/PVSC.2012.6317717 https://doi.org/10.1109/PVSC.2012.6317717
State	Published - 2012
Event	38th IEEE Photovoltaic Specialists Conference, PVSC 2012 - Austin, TX, United States Duration: 3 Jun 2012 → 8 Jun 2012

Conference

Conference	38th IEEE Photovoltaic Specialists Conference, PVSC 2012
Country/Territory	United States
City	Austin, TX
Period	3/06/12 → 8/06/12

Bibliographical note

See CP-5200-53969 for preprint

NREL Publication Number

NREL/CP-5200-56955

Keywords

calibration
peak watt
rating
reference cell
Si wafer

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Cite this

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AB - Rating the performance of photovoltaic (PV) modules is critical to determining the cost per watt, and efficiency is useful to assess the relative progress among PV concepts. Procedures for determining the efficiency for PV technologies from 1-sun to low concentration to high concentration are discussed. We also discuss the state of the art in primary and secondary calibration of PV reference cells used by calibration laboratories around the world. Finally, we consider challenges to rating PV technologies and areas for improvement.

KW - calibration

KW - peak watt

KW - rating

KW - reference cell

KW - Si wafer

UR - http://www.scopus.com/inward/record.url?scp=84869399994&partnerID=8YFLogxK

U2 - 10.1109/PVSC.2012.6317717

DO - 10.1109/PVSC.2012.6317717

M3 - Paper

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T2 - 38th IEEE Photovoltaic Specialists Conference, PVSC 2012

Y2 - 3 June 2012 through 8 June 2012

ER -

Calibration and Rating of Photovoltaics

Abstract

Conference

Bibliographical note

NREL Publication Number

Keywords

Access to Document

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Cite this