Abstract
We illustrate the capabilities of the High Voltage Stress Test (HVST) which operates continuously in the array field east of the Outdoor Test Facility at the National Renewable Energy Laboratory. Because we know that photovoltaic (PV) modules generating electrical power in both residential and utility-scale array installations will develop high-voltage biases approaching 600 VDC and 1,000 VDC,respectively, we expect such high voltages will result in current leakage between cells and ground, typically through the frames or mounts. We know that inevitably such leakage currents are capable of producing electrochemical corrosion that adversely impacts long-term module performance. With the HVST, we stress or operate PV modules under high-voltage bias, to characterize their leakagecurrents under all prevailing ambient conditions and assess performance changes emanating from high-voltage stress. We perform this test both on single modules and an active array.
Original language | American English |
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Number of pages | 5 |
State | Published - 2005 |
Event | 2005 DOE Solar Energy Technologies Program Review Meeting - Denver, Colorado Duration: 7 Nov 2005 → 10 Nov 2005 |
Conference
Conference | 2005 DOE Solar Energy Technologies Program Review Meeting |
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City | Denver, Colorado |
Period | 7/11/05 → 10/11/05 |
Bibliographical note
Presented at the 2005 DOE Solar Energy Technologies Program Review Meeting held November 7-10, 2005 in Denver, Colorado. Also included in the proceedings available on CD-ROM (DOE/GO-102006-2245; NREL/CD-520-38557)NREL Publication Number
- NREL/CP-520-38955
Keywords
- defect clusters
- NREL
- photovoltaics (PV)
- PV
- solar