Capacitance Characterization of Amorphous Silicon/Amorphous Silicon Germanium Heterostructures

Engineering

• Capacitance Measurement 50%
• Crystalline Silicon 50%
• Electron Emission 50%
• Forward Bias 50%
• Glow Discharge 50%
• Heterostructures 100%
• Pulse Duration 50%
• Reverse Bias 50%
• Saturation Value 50%
• Slow Component 50%
• Transients 100%

Material Science

• Amorphous Silicon 100%
• Capacitance 100%
• Capacitance Measurement 33%
• Density 33%
• Germanium 100%
• Heterojunction 100%
• Silicon 33%

Physics

• Amorphous Silicon 100%
• Capacitance Measurement 50%
• Electron Emission 50%
• Glow Discharge 50%
• Transients 100%